Comparison of Medmont flicker perimetry with Humphrey short wavelength perimetry and Humphrey frequency doubling perimetry showing kappa statistic, area under the ROC curve (AUC), quadrant analysis, and mean defect correlation
| Medmont flicker (strict) | Medmont flicker (loose) | |||
|---|---|---|---|---|
| Compared with | Compared with | |||
| Humphrey short wavelength perimetry | Humphrey frequency doubling perimetry | Humphrey SWAP | Humphrey FDP | |
| *p<0.001, **p<0.0001. | ||||
| Kappa statistic | 0.65 | 0.87 | 0.62 | 0.78 |
| AUC | 0.81 | 0.96 | ||
| Sector correlation (r2 statistic): | ||||
| Superonasal | 0.48** | 0.67** | ||
| Superotemporal | 0.25** | 0.79** | ||
| Inferonasal | 0.17* | 0.64** | ||
| Inferotemporal | 0.02 | 0.72** | ||
| Mean defect correlation (r2 statistic): | 0.57** | 0.79** | ||









