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Eccentricity and measurement variability and repeatability with the retinal thickness analyser
  1. Correspondence to: Chris Hudson School of Optometry, University of Waterloo, Waterloo, Ontario, N2L 3G1, Canada; chudsonscimail.uwaterloo.ca
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Gilmore ED, Hudson C
Eccentricity and measurement variability and repeatability with the retinal thickness analyser

Publication history

  • Accepted 4 April 2003
  • Published in print 1 January 2004.
  • Published online 23 December 2003.

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