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Eccentricity and measurement variability and repeatability with the retinal thickness analyser
- Correspondence to: Chris Hudson School of Optometry, University of Waterloo, Waterloo, Ontario, N2L 3G1, Canada; chudsonscimail.uwaterloo.ca
Citation
Eccentricity and measurement variability and repeatability with the retinal thickness analyser
Publication history
- Accepted April 4, 2003
- First published December 23, 2003.
Online issue publication
March 22, 2016
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Copyright 2004 British Journal of Ophthalmology