Comparison of Medmont flicker perimetry with Humphrey short wavelength perimetry and Humphrey frequency doubling perimetry showing kappa statistic, area under the ROC curve (AUC), quadrant analysis, and mean defect correlation
Medmont flicker (strict) | Medmont flicker (loose) | |||
---|---|---|---|---|
Compared with | Compared with | |||
Humphrey short wavelength perimetry | Humphrey frequency doubling perimetry | Humphrey SWAP | Humphrey FDP | |
*p<0.001, **p<0.0001. | ||||
Kappa statistic | 0.65 | 0.87 | 0.62 | 0.78 |
AUC | 0.81 | 0.96 | ||
Sector correlation (r2 statistic): | ||||
Superonasal | 0.48** | 0.67** | ||
Superotemporal | 0.25** | 0.79** | ||
Inferonasal | 0.17* | 0.64** | ||
Inferotemporal | 0.02 | 0.72** | ||
Mean defect correlation (r2 statistic): | 0.57** | 0.79** |